Surface Chemistry & Elemental State Intelligence
X-ray Photoelectron Spectroscopy (XPS) Analysis
Where surface chemistry governs adhesion, corrosion resistance, catalytic activity, and electronic performance, G-Hexa decodes elemental composition and chemical states through high-resolution XPS analysis. By measuring photoelectron binding energies, we reveal surface elemental distribution, oxidation states, and thin-film chemistry — transforming surface data into actionable engineering insight.
From Binding Energy to Chemical Identity
Material performance is often controlled by the outermost atomic layers — typically the top 1–10 nanometers. XPS provides quantitative elemental composition and chemical state information within this critical surface region.
At G-Hexa, XPS enables:
Elemental identification (except H and He)
Oxidation state analysis
Thin film chemistry evaluation
Surface contamination detection
Coating interface investigation
By correlating binding energy shifts with chemical environments, we bridge surface science with product reliability.
Advanced XPS Capabilities
Survey Scans
High-Resolution Core Level Scans
Quantitative Surface Composition
Depth Profiling (Ion Sputtering)
Chemical State Deconvolution
Angle-Resolved XPS
Expert Sample Preparation Workflow
- Cleanroom-level handling and storage
- Surface cleaning (if appropriate) without altering chemistry
- Mounting with electrical grounding
- Charge neutralization setup for insulating samples
- Calibration using reference standards (e.g., C 1s peak alignment)
- Repeat measurement validation
Challenges in XPS Analysis
Surface contamination, charging effects in non-conductive materials, and peak overlap can complicate interpretation. Improper sputtering may alter chemical states during depth profiling.
Our expertise ensures:
Accurate peak fitting and chemical state assignment
Reliable separation of overlapping elemental peaks
Correct interpretation of oxidation states
Controlled sputtering to preserve chemical authenticity
XPS spectra are interpreted chemically — not just numerically.
Manufacturing–Surface Correlation
| Material Domain | XPS Insight | Optimization Impact |
|---|---|---|
| Coatings | Oxide thickness & bonding chemistry | Adhesion and durability improvement |
| Aerospace Alloys | Surface oxidation states | Corrosion resistance enhancement |
| Battery Materials | SEI layer chemistry | Electrochemical stability control |
| Semiconductor Devices | Thin-film composition | Electronic reliability improvement |
| Polymers | Surface functional groups | Improved coating or bonding compatibility |
Trained Interpretation, Surface Certainty
Oxidation State Determination
Thin Film & Interface Analysis
Contamination & Failure Diagnosis
From Failure Analysis to Surface Engineering
XPS supports both diagnostic and developmental applications:
Corrosion product analysis
Adhesion failure investigation
Surface treatment validation
Thin-film deposition quality control
Catalyst surface chemistry evaluation
Each binding energy peak contributes to deeper chemical clarity.
